Life margin assessment with Physics of Failure Tools application to BGA packages. - Bruno Foucher; J. Tomas; F. Mounsi; M. Jeremias (Microelectron. Reliab., 2006)

Concept of smart integrated life consumption monitoring system for electronics. - Vincent Rouet; Frédéric Minault; Guillaume Diancourt; Bruno Foucher (Microelectron. Reliab., 2007)

Accelerated degradation data of SiC MOSFETs for lifetime and Remaining Useful Life assessment. - Thomas Santini; Sébastien Morand; Mitra Fouladirad; Luong-Viêt Phung; Florent Miller; Bruno Foucher; Antoine Grall; Bruno Allard (Microelectron. Reliab., 2014)