Use of signal processing imaging for the study of a 3D package in harsh environment. - Jean Augereau; Yves Ousten; Bruno Levrier; Laurent Béchou (Microelectron. Reliab., 2006)

Defect detection in multilayer ceramic capacitors. - V. Krieger; Wolfgang Wondrak; A. Dehbi; W. Bartel; Yves Ousten; Bruno Levrier (Microelectron. Reliab., 2006)