Segmentation of Integrated Circuit Layouts from Scan Electron Microscopy Images. - Bruno Machado Trindade; Eranga Ukwatta; Mike Spence; Chris Pawlowicz (CCECE, 2018)

A Data-Driven Approach for Automated Integrated Circuit Segmentation of Scan Electron Microscopy Images. - Zifan Yu; Bruno Machado Trindade; Michael Green; Zhikang Zhang; Pullela Sneha; Erfan Bank Tavakoli; Christopher Pawlowicz; Fengbo Ren (ICIP, 2022)

Automatic Error Detection in Integrated Circuits Image Segmentation: A Data-Driven Approach. - Zhikang Zhang; Bruno Machado Trindade; Michael Green; Zifan Yu; Christopher Pawlowicz; Fengbo Ren (ICASSP, 2023)