Testing the 400-MHz IBM Generation-4 CMOS Chip. - Thomas G. Foote; Dale E. Hoffman; William V. Huott; Timothy J. Koprowski; Bryan J. Robbins; Mary P. Kusko (ITC, 1997)

Advanced microprocessor test strategy and methodology. - William V. Huott; Timothy J. Koprowski; Bryan J. Robbins; Mary P. Kusko; Stephen Pateras; Dale E. Hoffman; Timothy G. McNamara; Thomas J. Snethen (IBM J. Res. Dev., 1997)

Microprocessor test and test tool methodology for the 500 MHz IBM S/390 G5 chip. - Mary P. Kusko; Bryan J. Robbins; Thomas J. Snethen; Peilin Song; Thomas G. Foote; William V. Huott (ITC, 1998)

Testing the 500-MHz IBM S/390 Microprocessor. - Thomas G. Foote; Dale E. Hoffman; William V. Huott; Timothy J. Koprowski; Mary P. Kusko; Bryan J. Robbins (IEEE Des. Test Comput., 1998)

99% AC test coverage using only LBIST on the 1 GHz IBM S/390 zSeries 900 Microprocessor. - Mary P. Kusko; Bryan J. Robbins; Timothy J. Koprowski; William V. Huott (ITC, 2001)

IBM System z9 eFUSE applications and methodology. - Richard F. Rizzolo; Thomas G. Foote; James M. Crafts; David A. Grosch; Tak O. Leung; David J. Lund; Bryan L. Mechtly; Bryan J. Robbins; Timothy J. Slegel; Michael J. Tremblay; Glen A. Wiedemeier (IBM J. Res. Dev., 2007)

Structural and functional test of IBM System z10 chips. - Gerard Salem; D. W. Wittig; Thomas G. Foote; Bryan J. Robbins; C. Hirko; Donato O. Forlenza; Franco Motika; J. A. Kyle; Mary P. Kusko; Orazio P. Forlenza; R. J. Frishmuth; Rona Yaari; et al. (IBM J. Res. Dev., 2009)

A 32nm 0.5V-supply dual-read 6T SRAM. - Jente B. Kuang; Jeremy D. Schaub; Fadi H. Gebara; Dieter F. Wendel; Sudesh Saroop; Tuyet Nguyen; Thomas Fröhnel; Antje Müller; Christopher M. Durham; Rolf Sautter; Bryan Lloyd; Bryan J. Robbins; et al. (CICC, 2010)