Multiple domain feature mapping: a methodology based on deep models of features. - S. S. Lim; Lennie E. N. Lim; Ivan Boon Hong Lee; Bryan K. A. Ngoi (J. Intell. Manuf., 1995)

High resolution AFM scanning Moiré method and its application to the micro-deformation in the BGA electronic package. - Huimin Xie; Anand K. Asundi; Chai Gin Boay; Lu Yunguang; Jin Yu; Zhaowei Zhong; Bryan K. A. Ngoi (Microelectron. Reliab., 2002)

Sub-Micron Patterning Titanium Nitride By Focused Ion-Beam Technique. - Jianxia Gao; Mary B. Chan-Park; Dongzhu Xie; Bryan K. A. Ngoi; Chee Yoon Yue (Int. J. Comput. Eng. Sci., 2003)