Novel Electrical Detection Method for Random Defects on Peripheral Circuits in NAND Flash Memory. - Bu-Il Nam; Young-Ha Choi; Sungki Hong; Ki-Young Dong; Wontaeck Jung; Sang-Won Park; Soon-Yong Lee; Dooyeun Jung; Byoung-Hee Kim; Eun-Kyoung Kim; Ki-Whan Song; Jai Hyuk Song; et al. (IRPS, 2022)

Integrated Circuit to Compensate Parasitic Leakage Component for WL Leakage Current in NAND Flash Memory. - Bu-Il Nam; Jayang Yoon; Kyunghea Lee; Sol Kim; Junhong Park; Chiweon Yoon; Eunkyoung Kim (A-SSCC, 2023)