A study of an abnormal ESD failure mechanism and threshold voltage caused by ESD current zapping sequence. - Yong-Ha Song; Choong-Kyun Kim; Moo-Young Park; Bum-Suk Kye; Jeongil Seo; Dong-Soo Cho; Taek-Soo Kim; Gab-soo Han (Microelectron. Reliab., 2004)