Attainable Accuracy of Autocalibrating VLSI Test Systems. - Burnell G. West (ITC, 1983)

500-MHz Testing on a 100-MHz Tester. - Didier Wimmers; Kris Sakaitani; Burnell G. West (ITC, 1994)

Functional ATE can meet the challenges. - Burnell G. West (ITC, 1998)

Accuracy requirements in at-speed functional test. - Burnell G. West (ITC, 1999)

At-speed structural test. - Burnell G. West (ITC, 1999)

The path to one-picosecond accuracy. - Luca Sartori; Burnell G. West (ITC, 2000)

Rapid-response temperature control provides new defect screening opportunities. - Mark Malinoski; Burnell G. West (ITC, 2001)

Open ATE Architecture: Key Challenges. - Burnell G. West (ITC, 2002)

Simultaneous Bidirectional Test Data Flow for a Low-cost Wafer Test Strategy. - Burnell G. West (ITC, 2003)

Multi-GB/s IC Test Challenges and Solutions. - Burnell G. West (ITC, 2003)

Open Architecture ATE: Prospects and Problems. - Burnell G. West (ITC, 2004)

Digital Synchronization for Reconfigurable ATE. - Burnell G. West; Michael F. Jones (ITC, 2004)