Comparative Study on Breakdown Characteristics for InGaAs Metamorphic High Electron Mobility Transistor and InGaAs/InP-Composite Channel Metamorphic High Electron Mobility Transistor. - Seok Gyu Choi; Jung Hun Oh; Bok-Hyung Lee; Byeong Ok Lim; Sung Woon Moon; Dong-Hoon Shin; Sam-Dong Kim; Jin Koo Rhee (IEICE Trans. Electron., 2006)