1-D fast normalized cross-correlation using additions. - Jae-Chern Yoo; Byoung Deog Choi; Hyoung-Kee Choi (Digit. Signal Process., 2010)

Hot hole-induced device degradation by drain junction reverse current. - K. S. Kim; H. J. Kim; P. H. Choi; H. S. Park; I. H. Joo; J. E. Song; D. H. Song; Byoung Deog Choi (Microelectron. Reliab., 2013)