Increasing Microprocessor Speed by Massive Application of On-Die High-K MIM Decoupling Capacitors. - Héctor Sánchez; Bill Johnstone; Doug Roberts; Om Mandhana; Brad Melnick; Muhsin Celik; Mike Baker; Jim Hayden; Byoung Min; John Edgerton; Bruce White (ISSCC, 2006)

Hot Carrier Reliability Improvement of Thicker Gate Oxide nFET Devices in Advanced FinFETs. - M. Iqbal Mahmud; Amit Gupta; Maria Toledano-Luque; N. Rao Mavilla; Jeffrey B. Johnson; P. Srinivasan 002; A. Zainuddin; S. Rao; Salvatore Cimino; Byoung Min; Tanya Nigam (IRPS, 2019)

Thermal Characterization and TCAD Modeling of a Power Amplifier in 45RFSOI for 5G mmWave Applications. - Peter C. Paliwoda; Mohamed A. Rabie; Oscar D. Restrepo; Eduardo Cruz Silva; E. Kaltalioglu; Fernando Guarin; Kenneth Barnett; Jeffrey B. Johnson; William Taylor; Myra Boenke; Byoung Min (IRPS, 2020)

A novel methodology to evaluate RF reliability for SOI CMOS-based Power Amplifier mmWave applications. - P. Srinivasan 002; Paul Colestock; Thomas Samuels; Stephen Moss; Fernando Guarin; Byoung Min (IRPS, 2020)

Reliability Failure Modes of an Integrated Ge Photodiode for Si Photonics. - Stewart E. Rauch; Dongho Lee; Alexey Vert; Lin Jiang; Byoung Min (OFC, 2020)

RF Reliability of SOI-based Power Amplifier FETs for mmWave 5G Applications. - P. Srinivasan 002; Fernando Guarin; Shafi Syed; Joris Angelo Sundaram Jerome; Wen Liu; Sameer H. Jain; Dimitri Lederer; Stephen Moss; Paul Colestock; Anirban Bandyopadhyay; Ned Cahoon; Byoung Min; et al. (IRPS, 2021)

Off-state TDDB in FinFET Technology and its Implication for Safe Operating Area. - Maria Toledano-Luque; Peter C. Paliwoda; Mohamed Nour; Thomas Kauerauf; Byoung Min; Germain Bossu; Mahesh Siddabathula; Tanya Nigam (IRPS, 2021)

Parasitic Drain Series Resistance Effects on Non-conducting Hot Carrier Reliability. - M. Hauser; P. Srinivasan 002; A. Vallett; R. Krishnasamy; Fernando Guarin; Dave Brochu; V. Pham; Byoung Min (IRPS, 2022)

Robust Off-State TDDB Reliability of n-LDMOS. - Wen Liu; Dimitris P. Ioannou; Johnatan Kantarovsky; Byoung Min; Tanya Nigam (IRPS, 2022)

RF long term aging behavior and reliability in 22FDX WiFi Power Amplifier designs for 5G applications. - P. Srinivasan 002; J. Lestage; Shafi Syed; X. Hui; Stephen Moss; Oscar D. Restrepo; Oscar H. Gonzalez; Y. Chen; T. McKay; Anirban Bandyopadhyay; Ned Cahoon; Fernando Guarin; et al. (IRPS, 2023)