Optimized Signature-Based Statistical Alternate Test for Mixed-Signal Performance Parameters. - Byoungho Kim; Hongjoong Shin; Ji Hwan (Paul) Chun; Jacob A. Abraham (ETS, 2006)

Spectral Prediction for Specification-Based Loopback Test of Embedded Mixed-Signal Circuits. - Hongjoong Shin; Byoungho Kim; Jacob A. Abraham (VTS, 2006)

Transformer-Coupled Loopback Test for Differential Mixed-Signal Specifications. - Byoungho Kim; Zhenhai Fu; Jacob A. Abraham (VTS, 2007)

Predicting mixed-signal dynamic performance using optimised signature-based alternate test. - Byoungho Kim; Hongjoong Shin; Ji Hwan (Paul) Chun; Jacob A. Abraham (IET Comput. Digit. Tech., 2007)

Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. - Byoungho Kim; Nash Khouzam; Jacob A. Abraham (VTS, 2008)

Efficient Loopback Test for Aperture Jitter in Embedded Mixed-Signal Circuits. - Byoungho Kim; Jacob A. Abraham (IEEE Trans. Circuits Syst. I Regul. Pap., 2011)

Transformer-Coupled Loopback Test for Differential Mixed-Signal Dynamic Specifications. - Byoungho Kim; Jacob A. Abraham (IEEE Trans. Instrum. Meas., 2011)

Imbalance-Based Self-Test for High-Speed Mixed-Signal Embedded Systems. - Byoungho Kim; Jacob A. Abraham (IEEE Trans. Circuits Syst. II Express Briefs, 2012)

Capacitor-Coupled Built-Off Self-Test in Analog and Mixed-Signal Embedded Systems. - Byoungho Kim; Jacob A. Abraham (IEEE Trans. Circuits Syst. II Express Briefs, 2013)

Dynamic Performance Characterization of Embedded Single-Ended Mixed-Signal Circuits. - Byoungho Kim; Jacob A. Abraham (IEEE Trans. Circuits Syst. II Express Briefs, 2014)

Bitstream-Driven Built-In Characterization for Analog and Mixed-Signal Embedded Circuits. - Byoungho Kim; Jacob A. Abraham (IEEE Trans. Circuits Syst. II Express Briefs, 2014)

Neuromorphic Hardware System for Visual Pattern Recognition With Memristor Array and CMOS Neuron. - Myonglae Chu; Byoungho Kim; Sangsu Park; Hyunsang Hwang; Moongu Jeon; Byoung Hun Lee; Byung-Geun Lee (IEEE Trans. Ind. Electron., 2015)

A 10-bit 200-MS/s Zero-Crossing-Based Pipeline ADC in 0.13-µm CMOS Technology. - Myonglae Chu; Byoungho Kim; Byung-Geun Lee (IEEE Trans. Very Large Scale Integr. Syst., 2015)

Dithering Loopback-Based Prediction Technique for Mixed-Signal Embedded System Specifications. - Byoungho Kim (IEEE Trans. Circuits Syst. II Express Briefs, 2016)

A Low-Power Incremental Delta-Sigma ADC for CMOS Image Sensors. - Ilseop Lee; Byoungho Kim; Byung-Geun Lee (IEEE Trans. Circuits Syst. II Express Briefs, 2016)

Spectral Leakage-Driven Loopback Scheme for Prediction of Mixed-Signal Circuit Specifications. - Byoungho Kim; Jacob A. Abraham (IEEE Trans. Ind. Electron., 2019)

Built-in Harmonic Prediction Scheme for Embedded Segmented-Data-Converters. - Byoungho Kim; Jacob A. Abraham (IEEE Access, 2020)

Built-off self-calibration scheme for ADCs based on shifting transfer-characteristics. - Myeonggu Gil; Jaehyun Park; Jacob A. Abraham; Byoungho Kim (IEICE Electron. Express, 2025)