Evaluating Colour Differences for Images. - Don Gyou Lee; M. Ronnier Luo; Guihua Cui; Byung-Chul Ahn (CGIV/MCS, 2008)

Numerical Modeling; Thickness Dependence of J-V Characteristic for Multi-Layered OLED Device. - Sang-Gun Lee; Hong-Seok Choi; Chang-Wook Han; Seok-Jong Lee; Yoon-Heung Tak; Byung-Chul Ahn (IEICE Trans. Electron., 2012)