A New Wafer Level Latent Defect Screening Methodology for Highly Reliable DRAM Using a Response Surface Method. - Junghyun Nam; Sunghoon Chun; Gibum Koo; Yanggi Kim; Byungsoo Moon; Jonghyoung Lim; Jaehoon Joo; Sangseok Kang; Hoonjung Kim; Kyeongseon Shin; Kisang Kang; Sungho Kang (ITC, 2008)

The Korteweg-de Vries equation on the quarter plane with asymptotically t-periodic data via the Fokas method. - Byungsoo Moon; Guenbo Hwang (Asymptot. Anal., 2018)