Effects of gamma-ray irradiation on polycrystalline silicon thin-film transistors. - N. A. Hastas; C. A. Dimitriadis; J. Brini; G. Kamarinos; V. K. Gueorguiev; S. Kaschieva (Microelectron. Reliab., 2003)

Effects of hydrogenation on the performance and stability of p-channel polycrystalline silicon thin-film transistors. - N. A. Hastas; C. A. Dimitriadis; F. V. Farmakis; G. Kamarinos (Microelectron. Reliab., 2003)

Built-in current sensor with reduced voltage drop using thin-film transistors. - Alkis A. Hatzopoulos; Stelios Siskos; Charalambos A. Dimitriadis; Nikolaos P. Papadopoulos (ISCAS (3), 2005)

Substrate current and degradation of n-channel polycrystalline silicon thin-film transistors. - N. A. Hastas; N. Archontas; C. A. Dimitriadis; G. Kamarinos; T. Nikolaidis; N. Georgoulas; Adonios Thanailakis (Microelectron. Reliab., 2005)

A threshold voltage variation cancellation technique for analogue peripheral circuits of a display array using poly-Si TFTs. - Ilias Pappas 001; Lazaros Nalpantidis; Vasilios Kalenteridis; Stilianos Siskos; Alkis A. Hatzopoulos; C. A. Dimitriadis (ISCAS, 2006)

Modeling the impact of light on the performance of polycrystalline thin-film transistors at the sub-threshold region. - Nikolaos P. Papadopoulos; Alkis A. Hatzopoulos; Dimitris K. Papakostas; C. A. Dimitriadis; Stilianos Siskos (Microelectron. J., 2006)

Effects of hot carriers in offset gated polysilicon thin-film transistors. - Argyrios T. Hatzopoulos; Dimitrios H. Tassis; N. Arpatzanis; C. A. Dimitriadis; G. Kamarinos (Microelectron. Reliab., 2006)

Dynamic hot-carrier induced degradation in n-channel polysilicon thin-film transistors. - Dimitrios H. Tassis; Argyrios T. Hatzopoulos; N. Arpatzanis; C. A. Dimitriadis; G. Kamarinos (Microelectron. Reliab., 2006)

Degradation of n-channel a-Si: H/nc-Si: H bilayer thin-film transistors under DC electrical stress. - N. Arpatzanis; Argyrios T. Hatzopoulos; Dimitrios H. Tassis; C. A. Dimitriadis; François Templier; Maher Oudwan; G. Kamarinos (Microelectron. Reliab., 2008)

A Fast and Compact Analog Buffer Design for Active Matrix Liquid Crystal Displays Using Polysilicon Thin-Film Transistors. - Ilias Pappas 001; Stilianos Siskos; Charalambos A. Dimitriadis (IEEE Trans. Circuits Syst. II Express Briefs, 2008)

A new linear voltage-to-current converter with threshold voltage compensation for analog circuits applications in polycrystalline silicon TFT process. - Ilias Pappas 001; Christoforos G. Theodorou; Stylianos Siskos; Charalambos A. Dimitriadis (ICECS, 2009)

Characteristics of double-gate polycrystalline silicon thin-film transistors for AMOLED pixel design. - Ilias Pappas 001; Dimitrios H. Tassis; Stilianos Siskos; Charalambos A. Dimitriadis (ICECS, 2010)

Hysteresis effect in bottom-gate polymorphous silicon thin-film transistors. - N. A. Hastas; N. Arpatzanis; C. A. Dimitriadis; Julien Brochet; François Templier; G. Kamarinos (Microelectron. Reliab., 2011)

Impact of front-back gate coupling on low frequency noise in 28 nm FDSOI MOSFETs. - Christoforos G. Theodorou; Eleftherios G. Ioannidis; Sébastien Haendler; Nicolas Planes; Franck Arnaud; Jalal Jomaah; Charalambos A. Dimitriadis; Gérard Ghibaudo (ESSDERC, 2012)

Compact modeling for the transcapacitances of undoped or lightly doped nanoscale cylindrical surrounding gate MOSFETs. - Nikolaos Fasarakis; Andreas Tsormpatzoglou; Dimitrios H. Tassis; Konstantinos Papathanasiou; C. A. Dimitriadis; Gérard Ghibaudo (ICECS, 2012)

Variability of nanoscale triple gate FinFETs: Prediction and analysis method. - Dimitrios H. Tassis; Ioannis Messaris; Nikolaos Fasarakis; Andreas Tsormpatzoglou; Spiros Nikolaidis 001; C. A. Dimitriadis (ICECS, 2014)

New LFN and RTN analysis methodology in 28 and 14nm FD-SOI MOSFETs. - Christoforos G. Theodorou; Eleftherios G. Ioannidis; Sébastien Haendler; Nicolas Planes; Emmanuel Josse; Charalambos A. Dimitriadis; Gérard Ghibaudo (IRPS, 2015)

Statistical characterization of drain current local and global variability in sub 15nm Si/SiGe Trigate pMOSFETs. - R. Lavieville; Theano A. Karatsori; Christoforos G. Theodorou; Sylvain Barraud; C. A. Dimitriadis; Gérard Ghibaudo (ESSDERC, 2016)

Noise-induced dynamic variability in nano-scale CMOS SRAM cells. - Christoforos G. Theodorou; Mouenes Fadlallah; Xavier Garros; Charalambos A. Dimitriadis; Gérard Ghibaudo (ESSDERC, 2016)

A comprehensive analysis of nanoscale single- and multi-gate MOSFETs. - Rupendra Kumar Sharma; Charalambos A. Dimitriadis; Matthias Bucher (Microelectron. J., 2016)

Hot carrier degradation modeling of short-channel n-FinFETs suitable for circuit simulators. - Ioannis Messaris; Theano A. Karatsori; Nikolaos Fasarakis; Christoforos G. Theodorou; Spiros Nikolaidis 001; Gérard Ghibaudo; C. A. Dimitriadis (Microelectron. Reliab., 2016)