Identifying electrical mechanisms responsible for functional failures during harsh external ESD and EMC aggression. - P. Besse; K. Abouda; C. Abouda (Microelectron. Reliab., 2011)

Latent gate oxide defects case studies. - Julien Goxe; C. Abouda; Béatrice Vanhuffel (Microelectron. Reliab., 2015)