A Comparative Study Between FinFET and CMOS-Based SRAMs under Resistive Defects. - Thiago Santos Copetti; Tiago R. Balen; E. Brum; C. Aquistapace; Leticia Bolzani Poehls (LATS, 2019)

Comparing the Impact of Power Supply Voltage on CMOS- and FinFET-Based SRAMs in the Presence of Resistive Defects. - Thiago Copetti; Tiago R. Balen; E. Brum; C. Aquistapace; Leticia Bolzani Poehls (J. Electron. Test., 2020)