System Level Policies for Fault Tolerance Issues in the FERMI Project. - A. Dell'Acqua; M. Hansen; Sami J. Inkinen; B. Lofstedt; J. P. Vanuxem; Christer Svensson; Jiren Yuan; H. Hentzell; L. Del Buono; J. David; J. F. Genat; H. Lebbolo; et al. (DFT, 1993)

Modeling and characterization of molding compound properties during cure. - Kaspar M. B. Jansen; C. Qian; Leo J. Ernst; C. Bohm; A. Kessler; Harald Preu; Matthias Stecher (Microelectron. Reliab., 2009)

Prediction of cure induced warpage of micro-electronic products. - Jan de Vreugd; Kaspar M. B. Jansen; Leo J. Ernst; C. Bohm (Microelectron. Reliab., 2010)