Peculiarities of electron tunnel injection to the drain of EEPROMs. - Nicolas Baboux; C. Busseret; Carole Plossu; Philippe Boivin (Microelectron. Reliab., 2007)

Parameters extraction of hafnium based gate oxide capacitors. - T. Nguyen; C. Busseret; Liviu Militaru; A. Poncet; D. Aimé; Nicolas Baboux; Carole Plossu (Microelectron. Reliab., 2007)