A Decoding Strategy Using Graph Partitioning for Continuous-Speech Recognition. - John R. Deller Jr.; C. C. Chiu; Y. P. Yang (ISCAS, 1994)

Reliability of interfacial adhesion in a multi-level copper/low-k interconnect structure. - C. C. Chiu; H. H. Chang; Chang-Chun Lee; C. C. Hsia; Kuo-Ning Chiang (Microelectron. Reliab., 2007)

Thermal behavior of self-heating effect in FinFET devices acting on back-end interconnects. - C. W. Chang; S. E. Liu; B. L. Lin; C. C. Chiu; Y.-H. Lee; K. Wu (IRPS, 2015)

An investigation of capacitance aging model for extreme low-k and high-k dielectrics. - M. N. Chang; Y.-H. Lee; S. Y. Lee; C. C. Chiu; D. Maji; K. Wu (IRPS, 2015)

Study of a new electromigration failure mechanism by novel test structure. - L. D. Chen; B. L. Lin; M.-H. Hsieh; C. W. Chang; J. S. Tsai; J. C. Peng; C. C. Chiu; Y.-H. Lee (IRPS, 2015)