The Analysis of Parallel BIST by the Combined Markov Chain (CMC) Model. - C. C. Chuang; Anup K. Gupta (ITC, 1989)

Product Acceptance Determination for Processes with Multiple Independent Lines. - Wen Lea Pearn; Chia-Huang Wu; C. C. Chuang (Qual. Reliab. Eng. Int., 2014)

The Demonstration of Gate Dielectric-fuse 4kb OTP Memory Feasible for Embedded Applications in High-k Metal-gate CMOS Generations and Beyond. - E. R. Hsieh; C. W. Chang; C. C. Chuang; H. W. Chen; Steve S. Chung (VLSI Circuits, 2019)