In-Process Improvement through Defect Data Interpretation. - Inderpal S. Bhandari; Michael J. Halliday; Jarir K. Chaar; Ram Chillarege; K. Jones; J. S. Atkinson; Cleo Lepori-Costello; P. Y. Jasper; E. D. Tarver; C. C. Lewis; M. Yonezawa (IBM Syst. J., 1994)

Integrated high-performance data compression in the IBM z13. - A. T. Sofia; C. C. Lewis; C. Jacobi; Damir A. Jamsek; Dale F. Riedy; J. Vogt; Peter G. Sutton; R. W. St. John (IBM J. Res. Dev., 2015)