Vth and Ron Instability of GaN Power HEMTs with pGaN Gate Under Negative Gate Bias. - S. L. Longato; Davide Favero; Arno Stockman; Arianna Nardo; Piet Vanmeerbeek; Marnix Tack; Gaudenzio Meneghesso; Enrico Zanoni; C. De Santi; Matteo Meneghini (IRPS, 2025)