Fouille de traces de jeu vidéo en compétition. Une approche stratégique et sportive. - François Rioult; Jean-Philippe Métivier; Boris Helleu; Nicolas Scelles; C. Durand (Ingénierie des Systèmes d Inf., 2012)

40-nm RFSOI technology exhibiting 90fs RON × COFF and fT/fMAX of 250 GHz/350 GHz targeting sub-6 GHz and mmW 5G applications. - S. Crémer; N. Pelloux; F. Gianesello; Y. Mourier; G. Haury; Tulio Chaves de Albuquerque; Frederic Monsieur; H. Audouin; C. A. Legrand; C. Diouf; J. Azevedo Goncalves; C. Belem Goncalves; et al. (ESSDERC, 2023)

A Versatile 55-nm SiGe BiCMOS Technology for Wired, Wireless, and Satcom Applications. - Pascal Chevalier 002; Florian Cacho; C. Durand; N. Derrier; V. Millon; Frederic Monsieur; A. Gauthier; P. Billy; Sébastien Fregonese; Thomas Zimmer; H. Audouin; Michel Buczko; et al. (BCICTS, 2024)

Zero-Overhead Nonintrusive Test of mmW Integrated Circuits Based on Wafer-Level Parametric Tests. - Olivier Occello; Marc Margalef-Rovira; Manuel J. Barragan Asian; C. Durand; A. Rhellab; Loic Vincent; Jordan Corsi; Sylvie Lépilliet; G. Ducournau; P. Ferrari (NewCAS, 2024)