Statistics in Semiconductor Test: Going beyond Yield. - W. Robert Daasch; C. Glenn Shirley; Amit Nahar (IEEE Des. Test Comput., 2009)

Board manufacturing test correlation to IC manufacturing test. - C. Glenn Shirley; W. Robert Daasch; Phil Nigh; Zoe Conroy (ITC, 2014)

Copula Models of Correlation: A DRAM Case Study. - C. Glenn Shirley; W. Robert Daasch (IEEE Trans. Computers, 2014)