Backside Hot Spot Detection Using Liquid Crystal Microscopy. - Olivier Crépel; Felix Beaudoin; Lionel Dantas de Morais; Gérald Haller; C. Goupil; Philippe Perdu; Romain Desplats; Dean Lewis (Microelectron. Reliab., 2002)

Magnetic field measurements for Non Destructive Failure Analysis. - Olivier Crépel; C. Goupil; Bernadette Domengès; Philippe Descamps; Philippe Perdu; A. Doukkali (Microelectron. Reliab., 2002)

Magnetic emission mapping for passive integrated components characterisation. - Olivier Crépel; Romain Desplats; Y. Bouttement; Philippe Perdu; C. Goupil; Philippe Descamps; Felix Beaudoin; L. Marina (Microelectron. Reliab., 2003)