A case study of defects due to process marginalities in deep sub-micron technology. - Hung-Sung Lin; Chun-Ming Chen; Kuo-Hsiung Chen; Afung Wang; C. H. Chao (Microelectron. Reliab., 2007)

Mandible Parameterization using a Reference Line. - M. J. Tsai; C. L. Chen; H. W. Lee; C. H. Chao; P. W. Hsu (BIOSIGNALS, 2012)