Feature extraction algorithm based on adaptive wavelet packet for surface defect classification. - C. S. Lee; C.-H. Choi; J. Y. Choi; Y. K. Kim; S. H. Choi (ICIP (2), 1996)

Study on electrostatic discharge (ESD) reliability improvement of ZnO-based multilayered chip varistor(MLV). - M. H. Ji; C.-H. Choi; B. K. Jang; B. K. Kim (Microelectron. Reliab., 2004)

Iterative learning control with advanced output data for nonlinear non-minimum phase systems. - Gu-Min Jeong; C.-H. Choi (Int. J. Syst. Sci., 2006)