The effect of atomic layer deposition temperature on switching properties of HfOx resistive RAM devices. - Katrina A. Morgan; Ruomeng Huang; Stuart Pearce; C. H. De Groot (ISCAS, 2014)

Total ionizing dose response of fluorine implanted Silicon-On-Insulator buried oxide. - Kenneth Potter; Katrina A. Morgan; Chris Shaw; Peter Ashburn; William Redman-White; C. H. De Groot (Microelectron. Reliab., 2014)

Composition-modulated electrodeposited PdNi-Si hydrogen sensors for low power applications. - C. H. De Groot; Long Tao Dong; A. Usgaocar; V. M. C. Chavagnac (ESSDERC, 2016)

Total Ionizing Dose, Random Dopant Fluctuations, and its combined effect in the 45 nm PDSOI node. - Eleni Chatzikyriakou; William Redman-White; C. H. De Groot (Microelectron. Reliab., 2017)

Modelling Resistive and Phase Change Memory with Passive Selector Arrays - A Matlab Tool. - Yasir J. Noori; C. H. De Groot (CoRR, 2019)