Preliminary results of storage accelerated aging test on InP/InGaAs DHBT. - G. A. Koné; Brice Grandchamp; C. Hainaut; François Marc; Cristell Maneux; Nathalie Labat; Thomas Zimmer; Virginie Nodjiadjim; Jean Godin (Microelectron. Reliab., 2010)

Reliability of submicron InGaAs/InP DHBT under thermal and electrical stresses. - G. A. Koné; Brice Grandchamp; C. Hainaut; François Marc; Cristell Maneux; Nathalie Labat; Thomas Zimmer; Virginie Nodjiadjim; Muriel Riet; Jean Godin (Microelectron. Reliab., 2011)