Reliability for Recessed Channel Structure n-MOSFET. - J. Y. Seo; K. J. Lee; Y. S. Kim; S. Y. Lee; S. J. Hwang; C. K. Yoon (Microelectron. Reliab., 2005)

Dielectric reliability of stacked Al2O3-HfO2 MIS capacitors with cylinder type for improving DRAM data retention characteristics. - J. Y. Seo; K. J. Lee; S. Y. Lee; S. J. Hwang; C. K. Yoon (Microelectron. Reliab., 2005)