Width dependence of the effectiveness of reservoir length in improving electromigration for Cu/Low-k interconnects. - C. M. Fu; Cher Ming Tan; S. H. Wu; H. B. Yao (Microelectron. Reliab., 2010)

An adaptive differential evolution algorithm with an aging leader and challengers mechanism. - C. M. Fu; Chao Jiang 005; G. S. Chen; Q. M. Liu (Appl. Soft Comput., 2017)