Estimation and control of power electronic device temperature during operation with variable conducting current. - Mahera Musallam; Paul P. Acarnley; C. Mark Johnson; Len Pritchard; Volker Pickert (IET Circuits Devices Syst., 2007)

Designing a Low-Cost, Electricity-Generating Cooking Stove. - Paul H. Riley; Chitta Saha; C. Mark Johnson (IEEE Technol. Soc. Mag., 2010)

Investigating the effects of dynamic demand side management within intelligent Smart Energy communities of future decentralized power system. - Amir Fazeli; Edward Christopher; C. Mark Johnson; Mark Gillott; Mark Sumner (ISGT Europe, 2011)

Microstructural evolution of ultrasonically bonded high purity Al wire during extended range thermal cycling. - Pearl A. Agyakwa; Martin R. Corfield; Li Yang; Jianfeng Li 002; V. M. F. Marques; C. Mark Johnson (Microelectron. Reliab., 2011)

A time-domain physics-of-failure model for the lifetime prediction of wire bond interconnects. - Li Yang; Pearl A. Agyakwa; C. Mark Johnson (Microelectron. Reliab., 2011)

Coordinated optimal dispatch of distributed energy resources within a smart energy community cell. - Amir Fazeli; Mark Sumner; C. Mark Johnson; Edward Christopher (ISGT Europe, 2012)

A closed-loop IGBT non-destructive tester. - Ashraf Ahmed; Yasaman Shadrokh; Lee Coulbeck; Alberto Castellazzi; C. Mark Johnson (Microelectron. Reliab., 2012)

Repetitive high peak current pulsed discharge film-capacitor reliability testing. - H. Q. S. Dang; Martin R. Corfield; Alberto Castellazzi; C. Mark Johnson; Patrick Wheeler 001 (Microelectron. Reliab., 2012)

An Efficient Implementation of the Rainflow Counting Algorithm for Life Consumption Estimation. - Mahera Musallam; C. Mark Johnson (IEEE Trans. Reliab., 2012)

Energy management research using emulators of renewable generation and loads. - Richard Davies; Amir Fazeli; Sung Pil Oe; Mark Sumner; Mark Johnson 002; Edward Christopher (ISGT, 2013)

Microgrid unbalance compensator - Mitigating the negative effects of unbalanced microgrid operation. - Sung Pil Oe; Edward Christopher; Mark Sumner; Seksak Pholboon; Mark Johnson 002; Stuart A. Norman (ISGT Europe, 2013)

Degradation of thermal interface materials for high-temperature power electronics applications. - Robert Skuriat; Jianfeng Li 002; Pearl A. Agyakwa; Nevil Mattey; Paul Evans; C. Mark Johnson (Microelectron. Reliab., 2013)

Reliability of thick Al wire: A study of the effects of wire bonding parameters on thermal cycling degradation rate using non-destructive methods. - Elaheh Arjmand; Pearl A. Agyakwa; C. Mark Johnson (Microelectron. Reliab., 2014)

Application of coupled electro-thermal and physics-of-failure-based analysis to the design of accelerated life tests for power modules. - Mahera Musallam; Chunyan Yin; Chris Bailey 001; C. Mark Johnson (Microelectron. Reliab., 2014)

FEA based thermal analysis of various topologies for Integrated Motor Drives (IMD). - Robert Abebe; Gaurang Vakil; Giovanni Lo Calzo; Tom Cox; Chris Gerada; Mark Johnson 002 (IECON, 2015)

A novel stochastic modelling approach for electric vehicle charging power and energy requirements. - Amir Fazeli; C. Mark Johnson; Mark Sumner; Edward Christopher (ISGT, 2015)

Investigating the impact of varying the number of distributed energy resources on controlling the power flow within a microgrid. - Amir Fazeli; Mark Sumner; C. Mark Johnson; Edward Christopher (ISGT, 2015)

Dependence of overcurrent failure modes of IGBT modules on interconnect technologies. - Imran Yaqub; Jianfeng Li 002; Christopher Mark Johnson (Microelectron. Reliab., 2015)

An integrated on-board battery charger with a nine-phase PM machine. - Nandor Bodo; Emil Levi; Ivan Subotic; Martin Jones 001; Jordi Espina; Lee Emprigham; Mark Johnson 002 (IECON, 2016)

A thermal cycling reliability study of ultrasonically bonded copper wires. - Elaheh Arjmand; Pearl A. Agyakwa; Martin R. Corfield; Jianfeng Li 002; Bassem Mouawad; C. Mark Johnson (Microelectron. Reliab., 2016)

Quantification of cracked area in thermal path of high-power multi-chip modules using transient thermal impedance measurement. - Mohd. Amir Eleffendi; Li Yang; Pearl A. Agyakwa; C. Mark Johnson (Microelectron. Reliab., 2016)

A study on probability of distribution loads based on expectation maximization algorithm. - Amin Ganjavi; Edward Christopher; Christopher Mark Johnson; Jon C. Clare (ISGT, 2017)

Comparison of power cycling reliability of flexible PCB interconnect smaller/thinner and larger/thicker power devices with topside Sn-3.5Ag solder joints. - Jianfeng Li 002; Jingru Dai; Christopher Mark Johnson (Microelectron. Reliab., 2018)