A Monte Carlo Particle Study of the Intrinsic Noise Figure in GaAs MESFET's. - C. Moglestue (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1985)

Pseudomorphic high electron mobility transistor monolithic microwave integrated circuits reliability study. - Wallace T. Anderson; Jason A. Roussos; Jeffrey A. Mittereder; Dimitrios E. Ioannou; C. Moglestue (Microelectron. Reliab., 2001)