HCS degradation of 5 nm oxide high-voltage PLDMOS. - C. Olk; Stefano Aresu; R. Rudolf; M. Röhner; Wolfgang Gustin; E. Stein Von Kamienski (Microelectron. Reliab., 2014)

A fWLR test structure and method for device reliability monitoring using product relevant circuits. - Rolf-Peter Vollertsen; Georg Georgakos; K. Kölpin; C. Olk (IRPS, 2015)