Scaling Trends and the Effect of Process Variations on the Soft Error Rate of advanced FinFET SRAMs. - Balaji Narasimham; H. Luk; C. Paone; A-R. Montoya; T. Riehle; Mike Smith; Liming Tsau (IRPS, 2023)

Scaling Trends and Bias Dependence of SRAM SER from 16-nm to 3-nm FinFET. - Balaji Narasimham; A-R. Montoya; C. Paone; T. Riehle; Mike Smith; Liming Tsau; Dennis R. Ball; Bharat L. Bhuva (IRPS, 2024)