Impacts of the recovery phenomena on the worst-case of damage in DC/AC stressed ultra-thin NO gate-oxide MOSFETs. - Alain Bravaix; Didier Goguenheim; Mickael Denais; Vincent Huard; C. R. Parthasarathy; F. Perrier; Nathalie Revil; E. Vincent (Microelectron. Reliab., 2005)

A thorough investigation of MOSFETs NBTI degradation. - Vincent Huard; Mickael Denais; F. Perrier; Nathalie Revil; C. R. Parthasarathy; Alain Bravaix; E. Vincent (Microelectron. Reliab., 2005)

NBTI degradation: From physical mechanisms to modelling. - Vincent Huard; Mickael Denais; C. R. Parthasarathy (Microelectron. Reliab., 2006)

Designing in reliability in advanced CMOS technologies. - C. R. Parthasarathy; Mickael Denais; Vincent Huard; G. Ribes; David Roy 001; Chloe Guérin; F. Perrier; E. Vincent; Alain Bravaix (Microelectron. Reliab., 2006)

Design-In Reliability for 90-65nm CMOS Nodes Submitted to Hot-Carriers and NBTI Degradation. - C. R. Parthasarathy; Alain Bravaix; Chloe Guérin; Mickael Denais; Vincent Huard (PATMOS, 2007)

Timing in-situ monitors: Implementation strategy and applications results. - Ahmed Benhassain; Florian Cacho; Vincent Huard; M. Saliva; Lorena Anghel; C. R. Parthasarathy; Abhishek Jain 003; Fabien Giner (CICC, 2015)

Activity profiling: Review of different solutions to develop reliable and performant design. - Florian Cacho; Ahmed Benhassain; Souhir Mhira; Ajith Sivadasan; Vincent Huard; P. Cathelin; Vincent Knopik; Abhishek Jain 003; C. R. Parthasarathy; Lorena Anghel (IOLTS, 2016)

Dynamic aging compensation and Safety measures in Automotive environment. - Souhir Mhira; Vincent Huard; Ahmed Benhassain; Florian Cacho; Sylvie Naudet; Abhishek Jain 003; C. R. Parthasarathy; Alain Bravaix (IOLTS, 2017)

Cognitive approach to support dynamic aging compensation. - Souhir Mhira; Vincent Huard; Ahmed Benhassain; Florian Cacho; David Meyer; Sylvie Naudet; Abhishek Jain 003; C. R. Parthasarathy; Alain Bravaix (ITC, 2017)