0.25 μm SOI technologies performance for low-power radio-frequency applications. - O. Rozeau; Sébastien Haendler; Jalal Jomaah; J. Boussey; Francis Balestra; C. Raynaud; J. L. Pelloie (ICECS, 2000)

An overview of hot-carrier induced degradation in 0.25 mum Partially and Fully Depleted SOI N-MOSFET's. - François Dieudonné; F. Daugé; Jalal Jomaah; C. Raynaud; Francis Balestra (Microelectron. Reliab., 2001)

Handcrafted features vs ConvNets in 2D echocardiographic images. - C. Raynaud; Hélène Langet; Mihaela Silvia Amzulescu; Eric Saloux; H. Bertrand; Pascal Allain; Paolo Piro (ISBI, 2017)