Linear feature detectors and their application to cereal inspection. - Edward Roy Davies; D. R. Mason; Michael Bateman; J. Chambers; C. Ridgway (EUSIPCO, 1998)

Design of efficient line segment detectors for cereal grain inspection. - E. R. Davies; Michael Bateman; D. R. Mason; J. Chambers; C. Ridgway (Pattern Recognit. Lett., 2003)