A flexible statistical model for CAD of submicrometer analog CMOS integrated circuits. - Christopher Michael; Christopher J. Abel; C. S. Teng (ICCAD, 1993)

Characterization of Transistor Mismatch for Statistical CAD of Submicron CMOS Analog Circuits. - Christopher J. Abel; Christopher Michael; Mohammed Ismail 001; C. S. Teng; R. Lahrio (ISCAS, 1993)