In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM). - Renuka Vallabhaneni; Ehsan Izadi; Carl R. Mayer; C. Shashank Kaira; Sudhanshu S. Singh; Jagannathan Rajagopalan; Nikhilesh Chawla (Microelectron. Reliab., 2017)