Analysis of the gate capacitance measurement technique and its application for the evaluation of hot-carrier degradation in submicrometer MOSFETs. - C. T. Hsu; M. M. Lau; Y. T. Yeow (Microelectron. Reliab., 2001)

SWOON: A Testbed for Secure Wireless Overlay Networks. - Yu-Lun Huang; J. Doug Tygar; Hsiao-Ying Lin; L. Y. Yeh; Hsin-Yi Tsai; Keith Sklower; Shiuh-Pyng Shieh; C. C. Wu; P. H. Lu; S. Y. Chien; Z. S. Lin; L. W. Hsu; et al. (CSET, 2008)