A Method of Delay Fault Test Generation. - C. Thomas Glover; M. Ray Mercer (DAC, 1988)

A Deterministic Approach to Adjacency Testing for Delay Faults. - C. Thomas Glover; M. Ray Mercer (DAC, 1989)

Testability considerations in the design of the MC68340 Integrated Processor Unit. - Philip E. Bishop; Grady Giles; Sudarshan Iyengar; C. Thomas Glover; Wai-On Law (ITC, 1990)

Mixed-mode ATPG under input constraints. - C. Thomas Glover (ITC, 1990)