Hot carrier reliability of RF N- LDMOS for S Band radar application. - M. Gares; Hichame Maanane; Mohamed Masmoudi; Pierre Bertram; Jérôme Marcon; Mohamed Ali Belaïd; Karine Mourgues; C. Tolant; Philippe Eudeline (Microelectron. Reliab., 2006)

Study of RF N- LDMOS critical electrical parameter drifts after a thermal and electrical ageing in pulsed RF. - Hichame Maanane; Mohamed Masmoudi; Jérôme Marcon; Mohamed Ali Belaïd; Karine Mourgues; C. Tolant; K. Ketata; Philippe Eudeline (Microelectron. Reliab., 2006)