Failure analysis methodology on donut pattern failure due to photovoltaic electrochemical effect. - Soh Ping Neo; Alfred C. T. Quah; Ghim Boon Ang; Dayanand Nagalingam; Hnin Hnin Ma; Siong Luong Ting; C. W. Soo; Changqing Chen; Zhihong Mai; Jeffrey Lam (Microelectron. Reliab., 2017)