The information processing factory: a paradigm for life cycle management of dependable systems. - Eberle A. Rambo; Thawra Kadeed; Rolf Ernst; Minjun Seo; Fadi J. Kurdahi; Bryan Donyanavard; Caio Batista de Melo; Biswadip Maity; Kasra Moazzemi; Kenneth Michael Stewart; Saehanseul Yi; Amir M. Rahmani; et al. (CODES+ISSS, 2019)

The Information Processing Factory: Organization, Terminology, and Definitions. - Eberle A. Rambo; Bryan Donyanavard; Minjun Seo; Florian Maurer 003; Thawra Kadeed; Caio Batista de Melo; Biswadip Maity; Anmol Surhonne; Andreas Herkersdorf; Fadi J. Kurdahi; Nikil D. Dutt; Rolf Ernst (CoRR, 2019)

Characterization of implied scenarios as families of common behavior. - Caio Batista de Melo; André Luiz Fernandes Cançado; Genaína Nunes Rodrigues (J. Syst. Softw., 2019)

Reflecting on Self-Aware Systems-on-Chip. - Bryan Donyanavard; Tiago Mück; Kasra Moazzemi; Biswadip Maity; Caio Batista de Melo; Kenneth Michael Stewart; Saehanseul Yi; Amir M. Rahmani; Nikil D. Dutt (A Journey of Embedded and Cyber-Physical Systems, 2021)

The Self-Aware Information Processing Factory Paradigm for Mixed-Critical Multiprocessing. - Eberle A. Rambo; Bryan Donyanavard; Minjun Seo; Florian Maurer 003; Thawra Kadeed; Caio Batista de Melo; Biswadip Maity; Anmol Surhonne; Andreas Herkersdorf; Fadi J. Kurdahi; Nikil D. Dutt; Rolf Ernst (IEEE Trans. Emerg. Top. Comput., 2022)

Information Processing Factory 2.0 - Self-awareness for Autonomous Collaborative Systems. - Nora Sperling; Alex Bendrick; Dominik Stöhrmann; Rolf Ernst; Bryan Donyanavard; Florian Maurer 003; Oliver Lenke; Anmol Surhonne; Andreas Herkersdorf; Walaa Amer; Caio Batista de Melo; Ping-Xiang Chen; et al. (DATE, 2023)

Reasoning About Emergent Behaviors at Runtime - Caio Batista de Melo (2023)

LOCoCAT: Low-Overhead Classification of CAN Bus Attack Types. - Caio Batista de Melo; Nikil D. Dutt (IEEE Embed. Syst. Lett., 2023)

SAFER: Safety Assurances for Emergent Behavior. - Caio Batista de Melo; Marzieh Ashrafiamiri; Minjun Seo; Fadi J. Kurdahi; Nikil D. Dutt (IEEE Des. Test, 2024)