Effectiveness Comparisons of Outlier Screening Methods for Frequency Dependent Defects on Complex ASICs. - Brady Benware; Robert Madge; Cam Lu; W. Robert Daasch (VTS, 2003)

Affordable and Effective Screening of Delay Defects in ASICs using the Inline Resistance Fault Model. - Brady Benware; Cam Lu; John Van Slyke; Prabhu Krishnamurthy; Robert Madge; Martin Keim; Mark Kassab; Janusz Rajski (ITC, 2004)