Localized thermal effect of sub-16nm FinFET technologies and its impact on circuit reliability designs and methodologies. - Yongsheng Sun; Canhui Zhan; Jianping Guo; Yiwei Fu; Guangming Li; Jun Xia (IRPS, 2015)

Placement mitigation techniques for power grid electromigration. - Wei Ye 008; Yibo Lin; Xiaoqing Xu; Wuxi Li; Yiwei Fu; Yongsheng Sun; Canhui Zhan; David Z. Pan (ISLPED, 2017)

New insights into the HCI degradation of pass-gate transistor in advanced FinFET technology. - Pengpeng Ren; Changze Liu; Sanping Wan; Jiayang Zhang; Zhuoqing Yu; Nie Liu; Yongsheng Sun; Runsheng Wang; Canhui Zhan; Zhenghao Gan; Waisum Wong; Yu Xia; et al. (IRPS, 2018)

Analog IC Aging-induced Degradation Estimation via Heterogeneous Graph Convolutional Networks. - Tinghuan Chen; Qi Sun 002; Canhui Zhan; Changze Liu; Huatao Yu; Bei Yu 001 (ASP-DAC, 2021)

Deep H-GCN: Fast Analog IC Aging-Induced Degradation Estimation. - Tinghuan Chen; Qi Sun 002; Canhui Zhan; Changze Liu; Huatao Yu; Bei Yu 001 (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 2022)