Methodology for electromigration critical threshold design rule evaluation. - J. Joseph Clement; Stefan P. Riege; Radenko Cvijetic; Carl V. Thompson (IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 1999)

A Comprehensive Layout Methodology and Layout-Specific Circuit Analyses for Three-Dimensional Integrated Circuits. - Syed M. Alam; Donald E. Troxel; Carl V. Thompson (ISQED, 2002)

Circuit Level Reliability Analysis of Cu Interconnects. - Syed M. Alam; Chee Lip Gan; Carl V. Thompson; Donald E. Troxel (ISQED, 2004)

Thermal aware cell-based full-chip electromigration reliability analysis. - Syed M. Alam; Donald E. Troxel; Carl V. Thompson (ACM Great Lakes Symposium on VLSI, 2005)

Electromigration Reliability Comparison of Cu and Al Interconnects. - Syed M. Alam; Frank L. Wei; Chee Lip Gan; Carl V. Thompson; Donald E. Troxel (ISQED, 2005)

Reliability computer-aided design tool for full-chip electromigration analysis and comparison with different interconnect metallizations. - Syed M. Alam; Chee Lip Gan; Carl V. Thompson; Donald E. Troxel (Microelectron. J., 2007)

Origin of physical degradation in AlGaN/GaN on Si high electron mobility transistors under reverse bias stressing. - Wardhana A. Sasangka; Govindo J. Syaranamual; Chee Lip Gan; Carl V. Thompson (IRPS, 2015)

Role of two-dimensional electron gas (2DEG) in AlGaN/GaN high electron mobility transistor (HEMT) ON-state degradation. - Govindo J. Syaranamual; Wardhana A. Sasangka; Riko I. Made; Subramaniam Arulkumaran; Geok Ing Ng; Siew Chuen Foo; Chee Lip Gan; Carl V. Thompson (Microelectron. Reliab., 2016)

Characterisation of defects generated during constant current InGaN-on-silicon LED operation. - Riko I. Made; Yu Gao; Govindo J. Syaranamual; Wardhana A. Sasangka; L. Zhang; Xuan Sang Nguyen; Y. Y. Tay; Jason Scott Herrin; Carl V. Thompson; Chee Lip Gan (Microelectron. Reliab., 2017)

Improved reliability of AlGaN/GaN-on-Si high electron mobility transistors (HEMTs) with high density silicon nitride passivation. - Wardhana A. Sasangka; Govindo J. Syaranamual; Y. Gao; Riko I. Made; Chee Lip Gan; Carl V. Thompson (Microelectron. Reliab., 2017)

Impact of carbon impurities on the initial leakage current of AlGaN/GaN high electron mobility transistors. - Wardhana A. Sasangka; Yu Gao; Chee Lip Gan; Carl V. Thompson (Microelectron. Reliab., 2018)