Reliability analysis of temperature step-stress tests on III-V high concentrator solar cells. - José Ramón González; Manuel Vázquez; Neftalí Núñez; Carlos Algora; Ignacio Rey-Stolle; Beatriz Galiana (Microelectron. Reliab., 2009)

Reliability of III-V concentrator solar cells. - Carlos Algora (Microelectron. Reliab., 2010)

Degradation mechanism analysis in temperature stress tests on III-V ultra-high concentrator solar cells using a 3D distributed model. - P. Espinet; Carlos Algora; José Ramón González; Neftalí Núñez; Manuel Vázquez (Microelectron. Reliab., 2010)

Novel accelerated testing method for III-V concentrator solar cells. - Neftalí Núñez; Manuel Vázquez; José Ramón González; Carlos Algora; P. Espinet (Microelectron. Reliab., 2010)